Showing results: 46 - 60 of 113 items found.
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PrecisionWoRx -
Onto Innovation
The PrecisionWoRx VX4 System gives test facilities and probe card manufacturers the ability to confidently test tighter pitches and smaller probe tips. The system can be easily configured to specific requirements for a variety of probe card technologies. For processes using cards with very small probe tips, the system’s high-resolution optics deliver a detailed field-of-view for high accuracy and repeatability.
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Signatone Corp.
Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
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Advanced Probing Systems, Inc.
APS is the global leader in the manufacture of probe needles used in cantilevered probe cards. All probe needles used in wafer sort are manufactured according to customer specifications using stringent in-process quality assurance procedures.
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Advanced Probing Systems, Inc.
Probe Needles are used for the fabrication of most probe cards, however there exist applications for which these materials may not be appropriate, e.g., hubrid device and gold pad probing.
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PXP-100B -
Teledyne LeCroy
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Extech SDL350 -
Extech Instruments Corporation
The SDL350 records data on an SD card in Excel format. Air Velocity/Air Flow meter with telescoping probe designed to fit into HVAC ducts and other small openings. Telescoping probe extends up to 7.05ft (215cm) maximum length with cable. Adjustable data sampling rate. Stores 99 readings manually and 20M readings via 2G SD card. Type K/J Thermocouple input for high temperature measurements. Large (9999 count) LCD displays Air Velocity or Air Flow and Temperature simultaneously. Record/Recall MIN, MAX, Data Hold and Auto power off. Complete with 6 x AA batteries, SD card, telescoping probe with cable, and hard carrying case.
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VIEW Micro-Metrology
VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.
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Extech SDL150 -
Extech Instruments Corporation
The SDL150 records data on an SD card in Excel format. Dual backlit display of Oxygen Concentration and Temperature. Measures dissolved oxygen from 0 to 20.0mg/L and 0 to 100.0% oxygen plus temperature from 32 to 122°F (0 to 50°C). Automatic Temperature Compensation from 0 to 50°C via temperature probe sensor built into polarographic type oxygen probe. Offset adjustment used for zero function to make relative measurements. Stores 99 readings manually and 20M readings via 2G SD card. User programmable sampling rate. Built-in PC interface. Min/Max and Data Hold functions, Auto power off. Complete with 6 x AA batteries, SD card, probe, two spare replacement membranes, electrolyte, and hard carrying case.
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MBP850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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FLP850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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XMC850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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PCIE850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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VPX850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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Model P7 -
Probing Solutions, Inc.
Made from 300 series stainless steel, the P7 probe holders accept all model 407 replaceable probe tips, and are secured with a set screw. When used with the P7 Tool Holder Adapter Arm; “Z” position adjustments are easy, and can accommodate a variety fixtures and probe card holders. Designed for both high temperature (-65 to 300°C) and high electrical isolation measurements.